Improvement of long tern reliabilities in Ti/MnO2/Pt resistive switching devices

Title
Improvement of long tern reliabilities in Ti/MnO2/Pt resistive switching devices
Authors
양민규윤호섭고태국이전국
Keywords
MnO2; Ti top electrode; resistive switching; non volatile memory; retention; long term reliability
Issue Date
2009-05
Publisher
지식경제부 차세대메모리 개발사업 2단계 2차년도 제3회 워크샵
URI
http://pubs.kist.re.kr/handle/201004/35300
Appears in Collections:
KIST Publication > Conference Paper
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE