Estimation of high-frequency loss properties through analytical calculation for semiconducting soft magnetic films in a near-field electromagnetic wave

Title
Estimation of high-frequency loss properties through analytical calculation for semiconducting soft magnetic films in a near-field electromagnetic wave
Authors
김상우이정환
Keywords
soft magnetic films; high-frequency loss; semiconducting; electromagnetic wave; near-field
Issue Date
2009-04
Publisher
Journal of applied physics
Citation
VOL 105, 07A529-1-07A529-3
Abstract
Gigahertz frequency characteristics were appraised by theoretical calculation based on a modified Landau–Lifshitz–Gilbert equation in order to examine the effect of electromagnetic induction and artificially controlled shape anisotropy in micropatterned magnetic films. Electromagnetic loss behaviors and magnetic fields of semiconducting soft magnetic films on a coplanar transmission line were numerically analyzed using a finite-element based electromagnetic solver. The combined relative permeability due to the electromagnetic induction and demagnetizing effect showed to be highly dependent on electrical resistivity and film thickness. Higher resistivity films at the same thickness of 2 m showed higher loss in power and lower reflection because of the reduced electromagnetic induction. Thinner magnetic films at the same resistivity of 100 cm exhibited lower reflection due to the reduced electromagnetic induction and maxima of the reflection shifted to higher frequencies because of demagnetization associated with the structure of magnetic flux path. A severe increment of the radiated electromagnetic noise with decreasing resistivity was caused by the reflection of the radiated noise from the surface of the low resistivity films on the coplanar line in gigahertz frequency bands. A slight increase in the radiation noise with increasing thickness at the same resistivity confirmed to be caused by the increased reflection.
URI
http://pubs.kist.re.kr/handle/201004/35458
ISSN
0021-8979
Appears in Collections:
KIST Publication > Article
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