X-ray Absorption and Emission Studies of Mn-doped ZnO Thin Films

Title
X-ray Absorption and Emission Studies of Mn-doped ZnO Thin Films
Authors
P. ThakurSanjeev Gautam채근화M. SubramanainR. JayavelK. Asokan
Keywords
X-ray absorption; X-ray emission; Diluted magnetic semiconductors
Issue Date
2009-07
Publisher
Journal of the Korean Physical Society
Citation
VOL 55, NO 1, 177-182
Abstract
The electronic structure of Mn-doped ZnO thin films, a dilute magnetic semiconductor (DMS) having possible room temperature (RT) ferromagnetism, synthesized with nominal compositions of Zn1−xMnxO (x = 0.03, 0.05, 0.07, 0.10, and 0.15) by using the spray pyrolysis method are investigated using soft X-ray absorption and emission spectroscopy. The intensity of the pre-edge spectral feature at the O K-edge increases with Mn concentration, which clearly reveals that there is a strong hybridization of Mn ions with the ZnO matrix. The near-edge X-ray absorption fine structure (NEXAFS) measurements at the Mn K- and L3,2-edges show a mixed valence nature for the Mn ions, with Mn2+ and Mn3+/Mn4+ states, and the Mn3+/Mn4+ states are observed to increase with the Mn-concentration. Mn L2,3 resonant inelastic X-ray scattering (RIXS) measurements show that the excess Mn interstitials appear in the sample and that direct exchange interactions with substitutional Mn atoms may explain the magnetic interaction in Mn-doped ZnO.
URI
http://pubs.kist.re.kr/handle/201004/35569
ISSN
0374-4884
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