Applications of nanomanipulator in nanowires

Title
Applications of nanomanipulator in nanowires
Authors
윤상원서종현안재평성태연이건배
Keywords
nano manipulator; FIB; Single nanowire Device; TEM; Device; Nanowire; Tensile test; Electrical resistance; RTA
Issue Date
2009-04
Publisher
한국분말야금학회지; Journal of Korean Powder Metallurgy Institute
Citation
VOL 16, NO 2, 138-145
Abstract
The combination of focused ion beam (FIB) and 4 point probe nanomanipulator could make various nano manufacturing and electrical measurements possible. In this study, we manufactured individual ZnO nanowire devices and measured those electrical properties. In addition, tensile experiments of metallic Au and Pd nanowires was performed by the same directional alignment of two nanomanipulators and a nanowire. It was confirmed from I-V curves that Ohmic contact is formed between electrodes and nanomanipulators, which is able to directly measure the elelctrical properties of a nanowire itself. In the mechanical tensile test, Au and Pd nanowires showed a totally different fracture behavior except the realignment from <110> to <002>. The deformation until the fracture was governed by twin for Au and by slip for Pd nanowires, respectively. The crystallographic relationship and fracture mechanism was discussed by TEM observations.
URI
http://pubs.kist.re.kr/handle/201004/36778
ISSN
1225-7591
Appears in Collections:
KIST Publication > Article
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