Anisotropic relaxation and crystallographic tilt in BiFeO3 on miscut SrTiO3 (001)
- Anisotropic relaxation and crystallographic tilt in BiFeO3 on miscut SrTiO3 (001)
- Rebecca J. Sichel; Alexei Grigoriev; Dal-Hyun Do; Seung-Hyub Baek; 장호원; Chad M. Folkman; Chang-Beom Eom; Zhonghou Cai; Paul G. Evans
- Strain relaxation; Crystallographic tilt; BiFeO3; 2M24180
- Issue Date
- Applied physics letters
- VOL 96, 051901-1-051901-3
- Epitaxial BiFeO3 thin films on miscut (001) SrTiO3 substrates relax via mechanisms leading to an
average rotation of the crystallographic axes of the BiFeO3 layer with respect to the substrate. The
angle of the rotation reaches a maximum in the plane defined by the surface normal of the film and
the direction of the surface miscut. X-ray microdiffraction images show that each BiFeO3 mosaic
block is rotated by a slightly different angle and contains multiple polarization domains. These
effects lead to a complicated overall symmetry in BiFeO3 thin films. This relaxation mechanism can
be extended to other complex oxides.
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