Measuring strength of VLS-grown Si nanowires: AFM bending vs. nanoindentation

Title
Measuring strength of VLS-grown Si nanowires: AFM bending vs. nanoindentation
Authors
김용재손광수정증현박원일장재일
Issue Date
2010-04
Publisher
Materials Research Society Spring 2010
URI
http://pubs.kist.re.kr/handle/201004/37806
Appears in Collections:
KIST Publication > Conference Paper
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