Spectroscopic Ellipsometry and Raman Spectroscopy of Ge-doped SbTe Thin Films

Title
Spectroscopic Ellipsometry and Raman Spectroscopy of Ge-doped SbTe Thin Films
Authors
박준우이호순강태동씨랜코이현석이수연정증현정병기
Issue Date
2010-04
Publisher
Material Research Society
URI
http://pubs.kist.re.kr/handle/201004/38768
Appears in Collections:
KIST Publication > Conference Paper
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