Investigation on the valence state of Te ions in the Bi6Ti5TeO22 thin film using X-ray photoelectron spectroscopy

Title
Investigation on the valence state of Te ions in the Bi6Ti5TeO22 thin film using X-ray photoelectron spectroscopy
Authors
최창학최주영조경훈유명재최재홍남산강종윤윤석진김종희
Keywords
Bi6Ti5TeO22; X-ray photoelectron spectroscopy; Thin film
Issue Date
2010-01
Publisher
Journal of the European Ceramic Society
Citation
VOL 30, NO 2, 517-520
Abstract
Bi6Ti5TeO22 (BTT) thin films were grown on a Pt/Ti/SiO2/Si(1 0 0) substrate under various conditions and the valence state of the Te ion was investigated. For the BTT films grown at 300 ℃, most of the Te ions existed as Te4+ ions. However, for the 10 mol% Mn-added BTT films grown at 300 ℃, Te6+ ions were found even in the film grown under low oxygen partial pressure (OPP) and their number increased with increasing OPP. This increase was attributed to the presence of Mn2+ ions, which assisted the transition of Te4+ ions to Te6+ ions in order to maintain the charge balance of the Ti4+ sites. Furthermore, in the films grown at 300 ℃ under a high OPP of 80.0 Pa and subsequently annealed at 600 ℃ under a high oxygen pressure of 101 kPa, most of the Te ions existed as Te6+ ions. However, for the film grown at 300 ℃ under low OPP, even though the film was annealed under a high oxygen pressure of 101 kPa, only a few of Te6+ ions were formed, whereas most of Te ions remained as the Te4+ ions.
URI
http://pubs.kist.re.kr/handle/201004/39301
ISSN
0955-2219
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KIST Publication > Article
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