Quantitative surface analysis of binary alloy thin films by depth profiling of TOF-SIMS and Dynamic SIMS

Title
Quantitative surface analysis of binary alloy thin films by depth profiling of TOF-SIMS and Dynamic SIMS
Authors
임원철이지혜이연희
Issue Date
2009-10
Publisher
대한화학회
URI
http://pubs.kist.re.kr/handle/201004/39365
Appears in Collections:
KIST Publication > Conference Paper
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