Electronic charge transfer in cobalt doped fullerene thin films and effect of energetic ion impacts by x-ray absorption spectroscopy

Title
Electronic charge transfer in cobalt doped fullerene thin films and effect of energetic ion impacts by x-ray absorption spectroscopy
Authors
P. ThakurArmi Kumar가우탐채근화
Keywords
Fullerene; Composite films; Ion beam; Raman; NEXAFS
Issue Date
2011-09
Publisher
Thin solid films
Citation
VOL 519, NO 23, 8401-8405
Abstract
We report on the electronic charge transfer in cobalt doped fullerene thin films by means of near-edge x-rayabsorption fine structure (NEXAFS) spectroscopy measurement. Co-doped fullerene films were prepared by co-deposition technique and subjected to energetic ion irradiation (120 MeV Au) for possibly alignment or interconnect of randomly distributed metal particles. Polarization dependent NEXAFS spectra revealed the alignment of Co and C atoms along the irradiated ionic path. The structural changes in Co-doped as-deposited and ion irradiated fullerene films were investigated by means of Raman spectroscopy measurements. Downshift of pentagonal pinch mode Ag(2) in Raman spectroscopy indicated the electronic charge transfer from Co atom to fullerene molecules, which is further confirmed by NEXAFS at C K-edge for Co-doped fullerene films.
URI
http://pubs.kist.re.kr/handle/201004/40339
ISSN
0040-6090
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KIST Publication > Article
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