Anomalous resonant frequency changes in piezoelectric microcantilevers by monolayer formation of AU films
- Anomalous resonant frequency changes in piezoelectric microcantilevers by monolayer formation of AU films
- 이정훈; 황교선; 윤대성; 김형석; 송승호; 강지윤; 김태송
- Microcantilever; Resonant frequency; Nanomechanics; Surface stress
- Issue Date
- Applied physics letters
- VOL 99, NO 14, 143701-1-143701-3
- Although the resonant frequency of a microcantilever has been reported to be changed by surface
stress and/or flexural rigidity, the reasons still remained unclear. Here, we present an observation of
anomalous resonant frequency change with positive values at 3.25 Å thickness of Au, where it
represents the monolayer formation of Au films. This result illustrates the surface stress-dependence
of the resonant frequency. The thickness at where the resonant frequency shift would become zero
through the compensation of the mass, and the surface stress is expected to be approximately three
monolayers (9.7 Å).
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