Effect of Ag film thickness on the optical and the electrical properties in CuAlO2/Ag/CuAlO2 multilayer films grown on glass substrates

Title
Effect of Ag film thickness on the optical and the electrical properties in CuAlO2/Ag/CuAlO2 multilayer films grown on glass substrates
Authors
오도현노영수김수연조운조곽계달김태환
Keywords
Thin films; TCO; CuAl2O3; Silver composite; Oxide materials; Electronic properties; Optical properties; Atomic force microscopy; AFM; X-ray diffraction
Issue Date
2011-02
Publisher
Journal of alloys and compounds
Citation
VOL 509, NO 5, 2176-2179
Abstract
Effects of Ag film thickness on the optical and the electrical properties in CuAlO2/Ag/CuAlO2 multilayer films grown on glass substrates were investigated. Atomic force microscopy images showed that Ag films with a thickness of a few nanometers had island structures. X-ray diffraction patterns showed that the phase of the CuAlO2 layer was amorphous. The resistivity of the 40 nm-CuAlO2/18 nm-Ag/40 nm-CuAlO2 multilayer films was 2.8 × 10−5 Ω cm, and the transmittance of the multilayer films with an Ag film thickness of 8 nm was approximately 89.16%. These results indicate that CuAlO2/Ag/CuAlO2 multilayer films grown on glass substrates hold promise for potential applications as transparent conducting electrodes in high-efficiency solar cells.
URI
http://pubs.kist.re.kr/handle/201004/41331
ISSN
0925-8388
Appears in Collections:
KIST Publication > Article
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