Application of Focused Ion Beam to Atom Probe Tomography Specimen Preparation from Mechanically Alloyed Powders

Title
Application of Focused Ion Beam to Atom Probe Tomography Specimen Preparation from Mechanically Alloyed Powders
Authors
최벽파Talaat Al-Kassab권영순김지순Reiner Kirchheim
Keywords
atom probe tomography; mechanically alloyed powder; focused ion beam; in situ lift-out technique; nanocrystalline materials
Issue Date
2007-10
Publisher
MICROSCOPY AND MICROANALYSIS
Citation
VOL 13, NO 5, 347-353
URI
http://pubs.kist.re.kr/handle/201004/41604
ISSN
1431-9276
Appears in Collections:
KIST Publication > Article
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