Atomic Force Microscopic Elasticity Measurement of Single-stranded DNA on Chemically-modificed Surface

Title
Atomic Force Microscopic Elasticity Measurement of Single-stranded DNA on Chemically-modificed Surface
Authors
나경환누엔티후옹이상명양성욱김진석윤의성
Keywords
AFM; DNA; elasticity; mechanical property; thiol-modified surface
Issue Date
2009-11
Publisher
대한기계학회 2009년도 추계학술대회
URI
http://pubs.kist.re.kr/handle/201004/41714
Appears in Collections:
KIST Publication > Conference Paper
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE