Investigation of the structural transformation behavior of Ge2Sb2Te5 thin films using high resolution electron microscopy

Title
Investigation of the structural transformation behavior of Ge2Sb2Te5 thin films using high resolution electron microscopy
Authors
김은태이정용김용태
Issue Date
2007-09
Publisher
Applied physics letters
Citation
VOL 91, 101909-1-101909-3
URI
http://pubs.kist.re.kr/handle/201004/42499
ISSN
0003-6951
Appears in Collections:
KIST Publication > Article
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