Characterization of dyed textiles using TOF-SIMS and FT-IR
- Characterization of dyed textiles using TOF-SIMS and FT-IR
- 이지혜; A. Ceglia; 김강진; 이연희
- ancient textile; indigo; TOF-SIMS; FT-IR
- Issue Date
- Surface and interface analysis : SIA
- VOL 44, NO 6, 653-657
- Within the field of archeology, textile research is of growing interest because of its potential to provide relevant information
regarding either the development or the technological advancement of ancient populations or the socio-economic and
religious purposes of textile production. It is of paramount importance in cultural heritage research to use non-destructive
techniques. Therefore, dye analyses were performed using two non-destructive methods: time-of-flight secondary ion mass
spectrometry (TOF-SIMS) and Fourier transform infrared spectroscopy (FT-IR). In order to build a database, standard samples
of dyed silk were prepared using several natural dye compounds; these samples were then analyzed with FT-IR and TOF-SIMS.
Afterwards, spectroscopic analyses were carried out on five textile fragments coming from the 16th to the 18th century
Korean tombs. FT-IR and TOF-SIMS spectra allowed the identification of fiber of the archeological textiles, making it possible
to distinguish between the cotton and silk fibers. Furthermore, it was possible to identify indigo in three blue fabrics and to
show its presence in a green textile. The results suggest that FT-IR and TOF-SIMS are two efficient and very helpful techniques
for the characterization of excavated fabrics.
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