A spectroscopic ellipsometry study on the variation of the optical constants of tin-doped indium oxide thin films during crystallization

Title
A spectroscopic ellipsometry study on the variation of the optical constants of tin-doped indium oxide thin films during crystallization
Authors
정연식
Keywords
Thin Films; Optical Properties; Light absorption and reflection
Issue Date
2004-02
Publisher
Solid State Communications
Citation
VOL 129, NO 8, 491-495
URI
http://pubs.kist.re.kr/handle/201004/43488
ISSN
0038-1098
Appears in Collections:
KIST Publication > Article
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