Flexible MEMS neural probe integrated with electrode array using polyimide and sucrose gel for reducing neuron damage

Title
Flexible MEMS neural probe integrated with electrode array using polyimide and sucrose gel for reducing neuron damage
Authors
전명건조제원김윤경정다희윤의성Sehyun Shin조일주
Keywords
MEMS neural probe; flexible probe; neuron damage; single unit recording; sucrose gel
Issue Date
2012-10
Publisher
Society for neuroscience
Abstract
In this paper, we have proposed and fabricated flexible MEMS neural probe, which has a partially flexible part to reduce neuron damage during insertion process and after being inserted. The fabricated flexible neural probe has a thin inserted part and it can reduce the brain damage during insertion. Also, the flexible part can reduce the brain damage induced by micro-motion of a brain. To maintain rigidity of the flexible part to be inserted into a brain, biodegradable sucrose gel is coated on the flexible part and it is dissolved in the brain after it is located in between skull and cortex. We also optimized the thickness of required sucrose gel by analytical equations and we performed insertion test to show that the flexible probe has enough stiffness to be insert into a brain without buckling of the structure. While the flexible probe is inserted into the brain, the flexible probe can be moved with the brain movement because the partially flexible part consisting of the polyimide is located between cortex and skull. To compare the neuron damage between conventional rigid MEMS probe and the proposed flexible neural probe, in-vivo test has been done with mice. 5-week after implantation of these probes, mice were sacrificed and brain slices were stained with CD11b and Hoechst to observe neuron damages. And, we confirmed that neural damage induced by this flexible probe is smaller than conventional neural probe by 4 times. As a result, the fabricated flexible MEMS neural probe reduces the neural damage compared to the conventional rigid MEMS neural probe.
URI
http://pubs.kist.re.kr/handle/201004/43914
Appears in Collections:
KIST Publication > Conference Paper
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