Fatigue-free, electrically reliable copper electrode with nanohole array

Title
Fatigue-free, electrically reliable copper electrode with nanohole array
Authors
김병준조이길정민석신해아슬문명운한흥남남기태주영창최인석
Issue Date
2012-10
Publisher
Small
Citation
VOL 8, NO 21, 3300-3306
Abstract
Design and fabrication of reliable electrodes is one of the most important challenges in fl exible devices, which undergo repeated deformation. In conventional approaches, mechanical and electrical properties of continuous metal fi lms degrade gradually because of the fatigue damage. The designed incorporation of nanoholes into Cu electrodes can enhance the reliability. In this study, the electrode shows extremely low electrical resistance change during bending fatigue because the nanoholes suppress crack initiation by preventing protrusion formation and damage propagation by crack tip blunting. This concept provides a key guideline for developing fatigue-free fl exible electrodes.
URI
http://pubs.kist.re.kr/handle/201004/43937
ISSN
16136810
Appears in Collections:
KIST Publication > Article
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