Study of surface morphology and grain size of irradiated MgO thin films

Title
Study of surface morphology and grain size of irradiated MgO thin films
Authors
Jitendra Pal SinghI. SulaniaJai PrakashSanjeev Gautam채근화D. KanjilalK. Asokan
Keywords
MgO; X-ray absorption spectroscopy.; Atomic force microscopy
Issue Date
2012-04
Publisher
Advanced Materials Letters
Citation
VOL 3, NO 2, 112-117
Abstract
Present work reports 200 MeV Ag15+ irradiation induced effects on the surface morphology, grain size and local electronic structure in MgO thin films deposited by e-beam evaporation under ultra High vacuum. The grain size was found to decrease from 37 nm (pristine film) to 23 nm for the sample irradiated with fluence of 1×1012 ions/㎠ and thereafter it increases upto fluence of 5×1012 ions/cm2. Similar changes with ion fluence were also observed for surface roughness. Shifting and disappearance of peaks in X-ray absorption spectra with irradiation shows the electronic structure modification after irradiation. The detailed analysis of observed results has been done on the basis of existing theories.
URI
http://pubs.kist.re.kr/handle/201004/44070
ISSN
09763961
Appears in Collections:
KIST Publication > Article
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