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dc.contributor.authorJitendra Pal Singh-
dc.contributor.authorI. Sulania-
dc.contributor.authorJai Prakash-
dc.contributor.authorSanjeev Gautam-
dc.contributor.author채근화-
dc.contributor.authorD. Kanjilal-
dc.contributor.authorK. Asokan-
dc.date.accessioned2015-12-03T00:54:27Z-
dc.date.available2015-12-03T00:54:27Z-
dc.date.issued201204-
dc.identifier.citationVOL 3, NO 2, 112-117-
dc.identifier.issn09763961-
dc.identifier.other38739-
dc.identifier.urihttp://pubs.kist.re.kr/handle/201004/44070-
dc.description.abstractPresent work reports 200 MeV Ag15+ irradiation induced effects on the surface morphology, grain size and local electronic structure in MgO thin films deposited by e-beam evaporation under ultra High vacuum. The grain size was found to decrease from 37 nm (pristine film) to 23 nm for the sample irradiated with fluence of 1×1012 ions/㎠ and thereafter it increases upto fluence of 5×1012 ions/cm2. Similar changes with ion fluence were also observed for surface roughness. Shifting and disappearance of peaks in X-ray absorption spectra with irradiation shows the electronic structure modification after irradiation. The detailed analysis of observed results has been done on the basis of existing theories.-
dc.publisherAdvanced Materials Letters-
dc.subjectMgO-
dc.subjectX-ray absorption spectroscopy.-
dc.subjectAtomic force microscopy-
dc.titleStudy of surface morphology and grain size of irradiated MgO thin films-
dc.typeArticle-
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