Near edge X-ray absorption fine structure study of Zn0.8Mg0.2O thin films

Title
Near edge X-ray absorption fine structure study of Zn0.8Mg0.2O thin films
Authors
Ankush VijAmanpal SinghRavi KumarSanjeev GautamDinesh Kumar채근화
Keywords
Sol-gel; X-ray diffraction; X-ray absorption spectroscopy
Issue Date
2013-04
Publisher
AIP conference proceedings
Citation
VOL 1536, 721-722
Abstract
We report the local electronic structure study of Zn0.8Mg0.2O thin films using x-ray absorption spectroscopy. The films were deposited on p-Si (100) substrates by sol-gel method and then annealed in O2 ambient for 1 hour. X-ray diffraction (XRD) confirmed the single phase wurtzite structure with a (002) preferred orientation. The near edge x-ray absorption fine structure (NEXAFS) spectrum collected at O K–edge indicates the presence of some oxygen vacancies in the film. The NEXAFS at Mg K-edge confirms the Mg doping into ZnO lattice. Zn L3-edge spectra feature reflects no Zn defect related features.
URI
http://pubs.kist.re.kr/handle/201004/45118
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KIST Publication > Conference Paper
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