Comparison of photoresponsive drain conduction and gate leakage in N-Channel pseudomorphic HEMT and MESFET under electro-optical stimulations

Title
Comparison of photoresponsive drain conduction and gate leakage in N-Channel pseudomorphic HEMT and MESFET under electro-optical stimulations
Authors
김동명김회종이정일이유종
Keywords
gate leakage; HEMT; MESFET; optical control; photoresponse
Issue Date
2000-06
Publisher
IEEE Electron Device Letters
Citation
VOL 21, NO 6, 264-267
URI
http://pubs.kist.re.kr/handle/201004/45312
ISSN
0741-3106
Appears in Collections:
KIST Publication > Article
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