An experimental investigation on the switching reliability of a phase change memory device with an oxidized TiN electrode

Title
An experimental investigation on the switching reliability of a phase change memory device with an oxidized TiN electrode
Authors
강대환김인호정증현정병기안동호이동복김현미김기범김수현
Keywords
Phase change memory
Issue Date
2006-09
Publisher
Journal of applied physics
Citation
VOL 100, 054506-1-054506-9
URI
http://pubs.kist.re.kr/handle/201004/45391
ISSN
0021-8979
Appears in Collections:
KIST Publication > Article
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