Improved lateral force calibration based on the angle conversion factor in atomic force microscopy

Title
Improved lateral force calibration based on the angle conversion factor in atomic force microscopy
Authors
최덕현황운봉윤의성
Keywords
Angle conversion factor; Atomic Force Microscopy; coefficient of friction; Lateral force calibration; calibration; Lateral force calibration factor; mica; twist angle
Issue Date
2007-11
Publisher
Journal of microscopy
Citation
VOL 228, 190-199
URI
http://pubs.kist.re.kr/handle/201004/45443
ISSN
0022-2720
Appears in Collections:
KIST Publication > Article
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