Improved lateral force calibration based on the angle conversion factor in atomic force microscopy
- Improved lateral force calibration based on the angle conversion factor in atomic force microscopy
- 최덕현; 황운봉; 윤의성
- Angle conversion factor; Atomic Force Microscopy; coefficient of friction; Lateral force calibration; calibration; Lateral force calibration factor; mica; twist angle
- Issue Date
- Journal of microscopy
- VOL 228, 190-199
- Appears in Collections:
- KIST Publication > Article
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