Structural Characteristics of Phosphorus-Doped C60 Thin Film Prepared by Radio Frequency-Plasma Assisted Thermal Evaporation Technique
- Structural Characteristics of Phosphorus-Doped C60 Thin Film Prepared by Radio Frequency-Plasma Assisted Thermal Evaporation Technique
- Arenst Andreas Arie; 이중기
- Phosphorus; C60; Raman Spectroscopy; Plasma Evaporation; Lithium Battery
- Issue Date
- Journal of nanoscience and nanotechnology
- VOL 12, NO 2, 1658-1661
- Phosphorus doped C60 (P:C60) thin films were prepared by a radio frequency plasma assisted thermal evaporation technique using C60 powder as a carbon source and a mixture of argon and phosphine (PH3) gas as a dopant precursor. The effects of the plasma power on the structural characteristics of the as-prepared films were then studied using Raman spectroscopy, Auger electron spectroscopy (AES) and X-ray photo-electrons spectroscopy (XPS). XPS and Auger analysis indicated that the films were mainly composed of C and P and that the concentration of P was proportional to the plasma power. The Raman results implied that the doped films contained a more disordered carbon structure than the un-doped samples. The P:C60 films were then used as a coating layer for the Si anodes of lithium ion secondary batteries. The cyclic voltammetry (CV) analysis of the P:C60 coated Si electrodes demonstrated that the P:C60 coating layer might be used to improve the transport of Li-ions at the electrode/electrolyte interface.
- Appears in Collections:
- KIST Publication > Article
- Files in This Item:
There are no files associated with this item.
- RIS (EndNote)
- XLS (Excel)
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.