In-situ observation of ion beam-induced nanostructure formation on a Cu(In,Ga)Se2 Surface
- In-situ observation of ion beam-induced nanostructure formation on a Cu(In,Ga)Se2 Surface
- 이지영; 성원경; 조민웅; 이광렬; 박종구; 문명운; 양철웅
- CIGS; Nanodot; Ion Beam; phase transition; FIB; self-assembly; nanostructure; in-situ SEM
- Issue Date
- Surface and interface analysis : SIA
- VOL 44, NO 11-12, 1542-1546
- We report a phenomenological study of Cu(In,Ga)Se2 (CIGS) dots and their morphological transition into nano-ridge shapes
induced by application of a focused ion beam (IB) to CIGS film. Real-time observations of nano-structure evolution during
IB irradiation were obtained by recording sequential images at various ion energies of 1 to 30 keV. We observed that as
irradiation time increased, the dots became larger and developed elongated ridge structures under continuous sputtering.
This transition process was induced by a combination of the Ostwald ripening processes and cluster diffusion. Compositional
analysis revealed that the nano-dots changed from pristine CIGS to Cu-rich CIGS. The Ga content of the dots was also found to
increase due to sputtered implantation, while levels of In and Se decreased.
- Appears in Collections:
- KIST Publication > Article
- Files in This Item:
There are no files associated with this item.
- RIS (EndNote)
- XLS (Excel)
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.