Crystal structure analysis using transmission electron microscopy (TEM)

Title
Crystal structure analysis using transmission electron microscopy (TEM)
Authors
장혜정
Keywords
TEM
Issue Date
2013-11
Publisher
한국결정학회지; Korean Journal of Crystallography
Abstract
The atomic and molecular crystal structure has been determined and studied using a method of X-ray crystallography in general. However, nano scale local crystal structure can be identified only by transmission electron microscopy (TEM) thanks to the small beam size. In this talk, the crystal structure analysis from amorphous material (ex: metallic glasses) through quasicrystal to crystal material (ex: ferroelectric materials) utilizing TEM will be introduced. The quasicrystal structure was first found during TEM analysis by Dan Shechtman who got the Nobel prize in Chemistry in 2011, and its discovery finally extended the definition of ‘crystal’ from ‘a repeating, three-dimensional pattern of atoms, ions, or molecules and having fixed distances between constituent parts.’ to ‘any solid having an essentially discrete diffraction diagram’, With the development of Cs-corrector recently, the crystal structure can be examined unitcell by unitcell and quantitatively across the interface using TEM or STEM, which cannot be done with any other characterization tool. With those cases, the usefulness of TEM for the crystal analysis of materials will be emphasized and further application will be discussed.
URI
http://pubs.kist.re.kr/handle/201004/46297
ISSN
12298700
Appears in Collections:
KIST Publication > Conference Paper
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