Improved Quantitative Analysis of Cu(In,Ga)Se2 Thin Film Using MCs+-SIMS Depth Profiling

Title
Improved Quantitative Analysis of Cu(In,Ga)Se2 Thin Film Using MCs+-SIMS Depth Profiling
Authors
이지혜김선희이강봉민병권이연희
Issue Date
2014-06
Publisher
Applied physics. A, Materials science & processing
Citation
VOL 115, NO 4, 1355-1364
Abstract
The chalcopyrite semiconductor, Cu(InGa)Se2 (CIGS), is popular as an absorber material for incorporation in high-efficiency photovoltaic devices because it has an appropriate band gap and a high absorption coefficient. To improve the efficiency of solar cells, many research groups have studied the quantitative characterization of the CIGS absorber layers. In this study, a compositional analysis of a CIGS thin film was performed by depth profiling in secondary ion mass spectrometry (SIMS) with MCs+ (where M denotes an element from the CIGS sample) cluster ion detection, and the relative sensitivity factor of the cluster ion was calculated. The emission of MCs+ ions from CIGS absorber elements, such as Cu, In, Ga, and Se, under Cs+ ion bombardment was investigated using time-of-flight SIMS (TOF-SIMS) and magnetic sector SIMS. The detection of MCs+ ions suppressed the matrix effects of varying concentrations of constituent elements of the CIGS thin films. The atomic concentrations of the CIGS absorber layers from the MCs+-SIMS exhibited more accurate quantification compared to those of elemental SIMS and agreed with those of inductively coupled plasma atomic emission spectrometry. Both TOF-SIMS and magnetic sector SIMS depth profiles showed a similar MCs+ distribution for the CIGS thin films.
URI
http://pubs.kist.re.kr/handle/201004/46377
ISSN
09478396
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KIST Publication > Article
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