Surface Analysis and Depth Profiling of Polymers by TOF-SIMS

Title
Surface Analysis and Depth Profiling of Polymers by TOF-SIMS
Authors
이연희이지혜김선희강민화
Issue Date
2013-02
Publisher
The 15th Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions
URI
http://pubs.kist.re.kr/handle/201004/46408
Appears in Collections:
KIST Publication > Conference Paper
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