Comparison of Quantitative Analysis for Photocoltaic CIGS Thin Films by SIMS Depth Profiling with Element Ions and MCs+ Clusters

Title
Comparison of Quantitative Analysis for Photocoltaic CIGS Thin Films by SIMS Depth Profiling with Element Ions and MCs+ Clusters
Authors
이연희이지혜김선희장윤정
Issue Date
2013-10
Publisher
European Conference on Applications of Surface and Interface Analysis
URI
http://pubs.kist.re.kr/handle/201004/46416
Appears in Collections:
KIST Publication > Conference Paper
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