Optical properties of AlAsxSb1-x alloys determined by in situ ellipsometry

Title
Optical properties of AlAsxSb1-x alloys determined by in situ ellipsometry
Authors
김준영윤재진T. J. KimY. D. Kim이은혜배민환송진동최원준C.-T. LiangY.-C. Chang
Keywords
AlAsSb; ellipsometry; MBE
Issue Date
2013-07
Publisher
Applied physics letters
Citation
VOL 103, NO 1, 011901-1-011901-4
Abstract
We report pseudodielectric function data <ε>&#8201;=&#8201;<ε1>&#8201;+ i<ε2> from 0.74 to 6.48&#8201;eV of oxide-free AlAsSb alloys that are the closest representation to date of the intrinsic bulk dielectric response ε of the material. Measurements were performed on 1.3&#8201;μm thick films grown on (001) GaAs substrates by molecular beam epitaxy. Data were obtained with the films in situ to avoid oxidation artifacts. Critical-point structures were identified by band-structure calculations done with the linear augmented Slater-type orbital method. Crossings of transitions at the Γ- and X-points and the Γ- and L-points with composition were observed.
URI
http://pubs.kist.re.kr/handle/201004/46623
ISSN
00036951
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