Analytic representation of the dielectric functions of InAsxSb1-x alloys in the parametric model

Title
Analytic representation of the dielectric functions of InAsxSb1-x alloys in the parametric model
Authors
S.Y. HwangT.J. KimJ.S. Byun닐리쉬M.S. DiwareY.D. KimD.E. AspnesJ.J. Yoon송진동
Keywords
Parametric model; Ellipsometry; MBE; InAsSb alloy; Dielectric function
Issue Date
2013-11
Publisher
Thin solid films
Citation
VOL 547, 276-279
Abstract
We report expressions that allow the dielectric functions ε = ε1 + iε2 from 1.5 to 6.0 eV of InAsxSb1-x alloys over the entire composition range 0 ≤ x ≤ 1 to be calculated analytically. We base our work on the parametric model (PM), which describes the dielectric functions of semiconductor materials as a sum of Gaussian-broadened polynomials. Our reference ε spectra are those that we obtained previously by spectroscopic ellipsometry for the specific compositions x = 0.000, 0.127, 0.337, 0.491, 0.726, and 1.000. The PM reconstructions are in excellent agreement with the data, and with the interpolations provided here, the model is extended to arbitrary compositions. We expect these results to be useful in a number of contexts, for example for the design of optoelectronic devices.
URI
http://pubs.kist.re.kr/handle/201004/46937
ISSN
00406090
Appears in Collections:
KIST Publication > Article
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE