Carrier Lifetime Extension via the Incorporation of Robust Hole/Electron Blocking Layers in Bulk Heterojunction Polymer Solar Cells

Title
Carrier Lifetime Extension via the Incorporation of Robust Hole/Electron Blocking Layers in Bulk Heterojunction Polymer Solar Cells
Authors
윤영운김형준조철희김슬기손해정고민재김홍곤이도권김진영이원목김범준김봉수
Keywords
Organic photovoltaics; Polymer solar cells; Power conversion efficiency; Hole mobility; Carrier lifetime; Recombination rate
Issue Date
2014-01
Publisher
ACS Applied Materials & Interfaces
Citation
VOL 6, NO 1, 333-339
Abstract
We report the achievement of a power conversion efficiency (PCE) improvement in P3HT:PCBM-based bulk-heterojunction type polymer solar cells using photocrosslinked P3HT (c-P3HT) as the electron blocking/hole extraction layer and titanium oxide nanoparticles (TiO2) as the hole blocking/electron extraction layer. Devices prepared with a 20 nm thick c- P3HT layer showed an improved PCE of 3.4% compared to devices prepared without the c- P3HT layer (PCE = 3.0%). This improvement was attributed to an extension in the carrier lifetime and an enhancement in the carrier mobility. The incorporation of the c-P3HT layer lengthened (by more than a factor of 2) the carrier lifetime and increased (by a factor of 5) the hole mobility. These results suggest that the c-P3HT layer not only prevented non-geminate recombination but it also improved carrier transport. The PCE was further improved to 4.0% through the insertion of a TiO2 layer that acted as an effective hole-blocking layer at the interface between the photoactive layer and the cathode. This work demonstrates that the incorporation of solution-processable hole and electron blocking/extraction layers offers an effective means for preventing nongeminate recombination at the interfaces between a photoactive layer and an electrode in bulk-heterojunction-type polymer solar cells.
URI
http://pubs.kist.re.kr/handle/201004/47011
ISSN
19448244
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KIST Publication > Article
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