Fabrication of p-n junction diode using SnO/SnO2 thin films and its device characteristics

Title
Fabrication of p-n junction diode using SnO/SnO2 thin films and its device characteristics
Authors
R. SathyamoorthyK. M. AbhiramiB. Gokul가우탐채근화K. Asokan
Keywords
SnO/SnO2 diode; raman analysis; TEM; thermal evaporation
Issue Date
2014-07
Publisher
Electronic materials letters
Citation
VOL 10, NO 4, 743-747
Abstract
Present study demonstrates the feasibility of using oxides of Sn to fabricate the p-n junction diode and reports the device characteristics. Reactive thermal evaporation method was used to fabricate the p-type SnO and n-type SnO2 multilayer thin films. The x-ray diffraction (XRD) and Raman spectra depict the presence of both SnO and SnO2 layers. The interface of the p-n junction analyzed by cross-sectional transmission electron microscope (TEM) images and selected area electron diffraction (SAED) pattern confirmed the presence of SnO-SnO2 layers. The diode shows rectifying current-voltage characteristics with forward threshold voltage of 3.5 V.
URI
http://pubs.kist.re.kr/handle/201004/48160
ISSN
17388090
Appears in Collections:
KIST Publication > Article
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