Quantitative Phase Analysis using X-ray diffraction, Function of peak separation in RIR(Reference Intensity Ratio) method

Abstract

Quantitative phase analysis using X-ray diffraction is based on the fact that diffraction intensity of certain phase in mixture depend on concentration. From several quantitative phase analysis, The RIR(Reference Intensity Ratio) method is used in case of no reference sample. In order to obtain a better accuracy and set from the effects of the texture is better to use many peaks as possible.

But, closely adjacent or overlapping peaks from different phase should be avoid choosing diffraction peaks. Such peaks can cause the convolution, and associated peaks increase the error rate. But in some cases, if using peak separation function of RIR method, the results would be expected concentration of more accurate than the previous method.