Quantitative Phase Analysis using X-ray diffraction, Function of peak separation in RIR(Reference Intensity Ratio) method

Title
Quantitative Phase Analysis using X-ray diffraction, Function of peak separation in RIR(Reference Intensity Ratio) method
Authors
양범진이윤주정일두원성옥
Keywords
XRD; RIR; Quantitative; Reference Intensity Ratio
Issue Date
2014-11
Publisher
한국결정학회지; Korean Journal of Crystallography
Abstract
Quantitative phase analysis using X-ray diffraction is based on the fact that diffraction intensity of certain phase in mixture depend on concentration. From several quantitative phase analysis, The RIR(Reference Intensity Ratio) method is used in case of no reference sample. In order to obtain a better accuracy and set from the effects of the texture is better to use many peaks as possible. But, closely adjacent or overlapping peaks from different phase should be avoid choosing diffraction peaks. Such peaks can cause the convolution, and associated peaks increase the error rate. But in some cases, if using peak separation function of RIR method, the results would be expected concentration of more accurate than the previous method.
URI
http://pubs.kist.re.kr/handle/201004/48730
ISSN
12298700
Appears in Collections:
KIST Publication > Conference Paper
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