Dark-field Transmission Electron Microscopy Imaging Technique to Visualize the Local Structure of Two-dimensional MAterial

Title
Dark-field Transmission Electron Microscopy Imaging Technique to Visualize the Local Structure of Two-dimensional MAterial; Graphene

Title
Graphene
Authors
나민영이승모김도향장혜정
Keywords
graphene; TEM; dark field image; grain structure; recrystallization
Issue Date
2015-04
Publisher
Applied Microscopy
Citation
VOL 45, NO 1, 23-31
Abstract
Dark field (DF) transmission electron microscopy image has become a popular characterization method for two-dimensional material, graphene, since it can visualize grain structure and multilayer islands, and further provide structural information such as crystal orientation relations, defects, etc. unlike other imaging tools. Here we present microstructure of graphene, particularly, using DF imaging. High-angle grain boundary formation wass observed in heat-treated chemical vapor deposition-grown graphene on the Si substrate using patch-quilted DF imaging processing, which is supposed to occur by strain around multilayer islands. Upon the crystal orientation between layers the multilayer islands were categorized into the oriented one and the twisted one, and their local structure were compared. In addition information from each diffraction spot in selected area diffraction pattern was summarized.
URI
http://pubs.kist.re.kr/handle/201004/49586
ISSN
22875123
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KIST Publication > Article
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