Defect Analysis of Solution Processed CIGSSe Thin Films with Different S/Se Distribution Based on Surface Photovoltage Using KPFM

Title
Defect Analysis of Solution Processed CIGSSe Thin Films with Different S/Se Distribution Based on Surface Photovoltage Using KPFM
Authors
박세진김해리민병권
Keywords
CIGSSe; KPFM; SPV; Solution process
Issue Date
2015-09
Publisher
18th International Conference on non contact Atomic Force Microscopy
URI
http://pubs.kist.re.kr/handle/201004/50352
Appears in Collections:
KIST Publication > Conference Paper
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