Suppressing Lateral Conduction Loss of Thin-film Cathode by Inserting a Denser Bridging Layer
- Suppressing Lateral Conduction Loss of Thin-film Cathode by Inserting a Denser Bridging Layer
- 박정훈; 이승환; 김형철; 윤경중; 이종호; 한승민; 손지원
- SOFC; Thin film cathode; PLD; current collection
- Issue Date
- Journal of the Korean Ceramic Society; 한국세라믹학회지
- VOL 52, NO 5, 304-307
- To reduce the lateral conduction loss of thin-film-processed cathodes, the microstructure of the thin-film cathode is engineered to contain a denser bridging layer in the middle. By doing so, the characteristic crack-like pores that separate the cathode domains in thin-film-processed cathodes and hamper lateral conduction are better connected and, as a result, the sheet resistance
of the cathode is effectively reduced by a factor of 5. This induces suppression of the lateral conduction loss and expansion of the effective current collecting area; the cell performance is improved by more than 30%.
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