전자현미경 기반의 차세대 핵심 나노분석기술

Title
전자현미경 기반의 차세대 핵심 나노분석기술
Authors
조진우김성훈변영운안재평
Keywords
TEM; Atom Probe; Hysitron
Issue Date
2015-01
Publisher
재료마당; Trends in metals & materials engineering
Citation
VOL 28, NO 1, 24-41
URI
http://pubs.kist.re.kr/handle/201004/51205
ISSN
17387507
Appears in Collections:
KIST Publication > ETC
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