Characterization of traditional Korean Lacquers using surface analytical techniques

Title
Characterization of traditional Korean Lacquers using surface analytical techniques
Authors
이지혜김민정김만호도정만한호규이연희
Keywords
Korean lacquer; Hwangchil; cultural heritage; FT-IR; XPS; TOF-SIMS
Issue Date
2015-12
Publisher
Surface and interface analysis : SIA
Citation
VOL 47, NO 13, 1180-1186
Abstract
Traditional Korean lacquer films, such as Otchil and Hwangchil, are natural paints extracted from Rhus vernicifera and Dendropanax morbifera trees that grow in the eastern part and on the west and south coast of the Korean Peninsula, respectively. Rhus lacquer has a black color, and Hwangchil has a transparent gold color and a rich camphoric perfume (benzoin). These lacquers have been used since ancient times. In this study, analytical techniques, such as Fourier transform infrared (FT-IR) spectroscopy, X-ray photoelectron spectroscopy (XPS), and time-of-flight secondary ion mass spectrometry (TOF-SIMS),were used to study the traditional Rhus lacquer and Hwangchil films, avoiding time-consuming and destructive extraction procedures. To compare the Rhus and Hwangchil lacquers, reference lacquer films were prepared using Rhus and Dendropanax saps. These films were then analyzed using FT-IR, XPS, and TOF-SIMS. After establishing the methodology using the reference lacquer films, surface analytical techniques were applied to two different plates painted by an artist. The results suggest that FT-IR, XPS, and TOF-SIMS are simple and complementary analytical techniques for the discrimination of old lacquer films.
URI
http://pubs.kist.re.kr/handle/201004/51228
ISSN
01422421
Appears in Collections:
KIST Publication > Article
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