Simultaneous reduction of copper and toxicity in semiconductor wastewater using protonated alginate beads

Title
Simultaneous reduction of copper and toxicity in semiconductor wastewater using protonated alginate beads
Authors
방성환최재우조강우정종민강호정홍석원
Keywords
Acute toxicity; Copper sorption; Semiconductor wastewater; Test battery; Toxicity identification
Issue Date
2016-03
Publisher
Chemical engineering journal
Citation
VOL 288, 525-531
Abstract
Using protonated alginate (HA) beads, copper (Cu2+) levels and toxicity were concurrently reduced in semiconductor wastewater produced from the chemical mechanical planarization process. The beneficial effect of protonation could be explained by a reduction in the release of Ca2+, which is a competitive cation during sorption of Cu2+, leading to an increased in the sorption capacity from 107 to 189 mg/g. Monitoring of the acute toxicity of two different types of semiconductor wastewater toward Daphnia magna suggested that Cu2+ was the cause of toxicity. The toxicity identification evaluation using D. magna indicated that Cu2+ was a major toxicant in the raw wastewater with concentrations of 1.97 and 3.37 mg/L for two different raw wastewater samples with initial toxicities of 14.2 and 23.6 toxic unit (TU), respectively. This relationship was verified by the correlation coefficients between Cu2+ concentration and acute toxicity (r2 = 0.829 at P < 0.05 and 0.894 at P < 0.05 for two types of semiconductor wastewater) in mass balance tests. The laboratory continuous column test using HA beads showed that the Cu2+ concentration in effluent was proportional to the acute toxicity. In particular, the TU values increased sharply when the residual concentration of Cu2+ exceeded 0.1 mg/L. The test battery results indicated that D. magna was more sensitive than other aquatic species, i.e., algae and bacteria, to Cu2+ in semiconductor wastewater.
URI
http://pubs.kist.re.kr/handle/201004/58335
ISSN
13858947
Appears in Collections:
KIST Publication > Article
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