Fully subthreshold current-based characterization of interface traps and surface potential in III?V-on-insulator MOSFETs

Title
Fully subthreshold current-based characterization of interface traps and surface potential in III?V-on-insulator MOSFETs
Authors
최원준김상현김성광금대명이정민박민수최성진김대환김동명
Issue Date
2016-04
Publisher
Solid-state electronics
Citation
VOL 122, 8-12
URI
http://pubs.kist.re.kr/handle/201004/59386
ISSN
00381101
Appears in Collections:
KIST Publication > Article
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