Comparative study of atomic arrangements in equiatomic GeSe and GeTe films before and after crystallization

Title
Comparative study of atomic arrangements in equiatomic GeSe and GeTe films before and after crystallization
Authors
정병기Yong Gyu ChoiSang Yeol ShinRoman GolovchakHimanshu Jain
Keywords
amorphous chalcogenide film; EXAFS analysis; Electrical properties; phase change material; threshold switching device
Issue Date
2016-06
Publisher
Journal of alloys and compounds
Citation
VOL 686, 273
URI
http://pubs.kist.re.kr/handle/201004/59704
ISSN
09258388
Appears in Collections:
KIST Publication > Article
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE