Influence of interface traps inside the conduction band on the capacitance?voltage characteristics of InGaAs metal?oxide?semiconductor capacitors

Title
Influence of interface traps inside the conduction band on the capacitance?voltage characteristics of InGaAs metal?oxide?semiconductor capacitors
Authors
김상현Noriyuki TaokaMasafumi YokoyamaRena SuzukiRyo IidaMitsuru TakenakaShinichi Takagi
Issue Date
2016-10
Publisher
Applied Physics Express
Citation
VOL 9
URI
http://pubs.kist.re.kr/handle/201004/60224
ISSN
18820778
Appears in Collections:
KIST Publication > Article
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