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Impact of Device Area and Film Thickness on Performance of Sol-gel Processed ZrO2 RRAM

Title
Impact of Device Area and Film Thickness on Performance of Sol-gel Processed ZrO2 RRAM
Authors
이소정; 김태균; 장봉호; 이원용; 송규찬; 김현서; 도경엽; 황승범; 정승준; 장재원
Issue Date
2018-03
Publisher
IEEE Electron Device Letters
URI
http://pubs.kist.re.kr/handle/201004/61303
ISSN
07413106
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KIST Publication > Article
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