Impact of Device Area and Film Thickness on Performance of Sol-gel Processed ZrO2 RRAM

Title
Impact of Device Area and Film Thickness on Performance of Sol-gel Processed ZrO2 RRAM
Authors
이소정김태균장봉호이원용송규찬김현서도경엽황승범정승준장재원
Issue Date
2018-03
Publisher
IEEE Electron Device Letters
URI
http://pubs.kist.re.kr/handle/201004/61303
ISSN
07413106
Appears in Collections:
KIST Publication > Article
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