Trapped charge modulation at the MoS2/SiO2 interface by a lateral electric field in MoS2 field-effect transistors

Title
Trapped charge modulation at the MoS2/SiO2 interface by a lateral electric field in MoS2 field-effect transistors
Authors
정승준박진수조경준김재근장연식신지원김재영서준석이탁희
Issue Date
2019-01
Publisher
Nano Futures
Citation
VOL 3, NO 1
URI
http://pubs.kist.re.kr/handle/201004/62163
ISSN
23991984
Appears in Collections:
KIST Publication > Article
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