Series Resistance Effects on the Back-gate Biased Operation of Junctionless Transistors

Title
Series Resistance Effects on the Back-gate Biased Operation of Junctionless Transistors
Authors
전대영So Jeong ParkMireille MouisSylvain BarraudGyu-Tae KimGerard Ghibaudo
Keywords
Series resistance; Back-gate effects; Junctionless transistors; Threshold voltage; Flat-band voltage
Issue Date
2019-04
Publisher
EUROSOI-ULIS2019
URI
http://pubs.kist.re.kr/handle/201004/62205
ISSN
-
Appears in Collections:
KIST Publication > Conference Paper
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