Simple Method for Determining Channel Doping Concentration of Highly Doped FD-SOI Devices

Title
Simple Method for Determining Channel Doping Concentration of Highly Doped FD-SOI Devices
Authors
전대영So Jeong ParkGyu-Tae Kim
Keywords
Extraction method; Doping concentration; Highly doped channel; Threshold voltage; Flat-band voltage; Numerical simulation
Issue Date
2019-04
Publisher
EUROSOI-ULIS2019
URI
http://pubs.kist.re.kr/handle/201004/62206
ISSN
-
Appears in Collections:
KIST Publication > Conference Paper
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