Real-time effect of electron beam on MoS2 field-effect transistors

Title
Real-time effect of electron beam on MoS2 field-effect transistors
Authors
안재평김양희이국진이혜빈최준희신동훈조영훈장호균이상욱신진우지현진김규태
Keywords
E-beam irradiation; MoS2; charge trap; in situ measurement; low-frequency noise
Issue Date
2020-08
Publisher
Nanotechnology
URI
http://pubs.kist.re.kr/handle/201004/63730
ISSN
0957-4484
Appears in Collections:
KIST Publication > Article
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